Pollution standards TSI 2200-01-5002, 2200-01-5001, etc.

Plate and mesh contamination standards are used to develop semiconductor control tools, process tools, and manufacturing processes. They are used in factories with control systems and processes for certification and acceptance, as well as for maintenance of equipment/processes and productivity during their service life.

The Qual-Dep pollution Qualification standards are standards for specific tools that test performance, reduce acceptance risk, and help align/align control systems.

Dimensions: 200 mm, 300 mm, 100 mm, 150 mm, etc.

• Qualification standards of pollution Qual-Dep. Technical specifications.

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The pollution standards developed by Dev-Dep are fully adapted to the unique and complex requirements of your inspection or metrological application with the support of MSP particle deposition experts.

Articles: 2200-01-5002, 2200-01-5001.

• Standards of contamination of the reticle Dev-Dep Development. Technical specifications.
• Dev-Dep Development Plate Contamination Standards. Technical specifications.

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Cal-Dep pollution calibration standards are high-precision standards with a competitive price, built on the basis of well-defined, industry-accepted recipes to maintain the productivity and productivity of conventional control and metrological instruments over many years of service.

Models: 2200-01-5065, 2200-01-5066, 2200-01-5067.

• Cal-Dep calibration plate contamination standards. Technical specifications.

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DOCUMENTS

• Квалификационные стандарты загрязнения Qual-Dep. Технические характеристики.
• Стандарты загрязнения прицельной сетки Dev-Dep Development. Технические характеристики.
• Стандарты загрязнения пластин Dev-Dep Development. Технические характеристики.
• Стандарты загрязнения калибровочной пластины Cal-Dep. Технические характеристики.